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Mots clés
Metal-insulator transition
Pb centers
8140Ef
Energy loss
15N
Nickel
6855Jk
Channeling
17Opp
Acoustic
Thin film
RBS
Nuclear reaction analysis
Diffusion
XRD
7630Lh
Adsorption Isotherms
Periodic multilayer
GaMnAs
Ferromagnetic resonance
27Ald p&α
AFM
Stable isotopic tracing
Indium oxide
Silicon Carbide
2H
Gallium oxide
Photoluminescence
Alloys
Al2O3
AC susceptibility
3C-SiC
PIXE
Density functional theory
7550Ee
Nanoparticles
Pulsed laser deposition
Annealing
Oxygen deficiency
Thin films
Ion beam analysis
Passivation
Defects
13C
Growth
Measurement
Epitaxy
Aluminium
NRP
HfO2
Low energy electron diffraction LEED
X-ray diffraction
17Op
Magnetization curves
Interface defects
Capillary condensation
Transparent conductive oxide TCO
Silicon
Kossel diffraction
7550Pp
Gold
Magnetic anisotropy
Alloy
Magnetic semiconductors
Ageing
Silicon carbide
ALD
Topological defects
Nitridation
Evaluation
Adsorbed layers
Nanostructures
Rutherford backscattering spectrometry RBS
Atomic Layer Deposition ALD
SiC
Hysteresis
18O resonance
27Alda
Raman spectroscopy
Charge exchange
Silica
Epitaxial growth
Aluminum
Adsorption
Oxidation
ADSORPTION DESORPTION HYSTERESIS
Multilayer
Topological insulators
Auger electron spectroscopy AES
Acoustic propreties of solid
Isotopic Tracing
XPS
27Aldp
Ion implantation
EPR
18O
Nuclear resonance profiling NRP
Zinc oxide
Sputtering
17O